The structure of Sb(111) determined by photoelectron diffractionBENGIO, S; WELLS, J. W; KIM, T. K et al.Surface science. 2007, Vol 601, Num 14, pp 2908-2911, issn 0039-6028, 4 p.Article

Photoelectron spectroscopy (PES) and photoelectron diffraction (XPD) studies on the local adsorption of cyclopentene on Si(100)WEIER, D; LÜHR, T; BEIMBORN, A et al.Surface science. 2010, Vol 604, Num 19-20, pp 1608-1613, issn 0039-6028, 6 p.Article

Quantitative determination of the local structure of thymine on Cu( 110) using scanned-energy mode photoelectron diffractionALLEGRETTI, F; POLCIK, M; WOODRUFF, D. P et al.Surface science. 2007, Vol 601, Num 17, pp 3611-3622, issn 0039-6028, 12 p.Article

Photoelectron diffraction structure determination of Cu(100)c(2 × 2)-NHOEFT, J. T; POLCIK, M; KITTEL, M et al.Surface science. 2001, Vol 492, Num 1-2, pp 1-10, issn 0039-6028Article

A new algorithm for path exploration in photoelectron diffractionGAVAZA, Mihai; SEBILLEAU, Didier.Surface science. 2001, Vol 482-85, pp 1463-1467, issn 0039-6028, 2Conference Paper

Fe/Si(111) interface formation studied by photoelectron diffractionAVILA, J; MASCARAQUE, A; TEODORESCU, C et al.Surface science. 1997, Vol 377-79, pp 856-860, issn 0039-6028Conference Paper

Imaging scatterer planes by photoelectron diffractionSEELMANN-EGGEBERT, M.Surface science. 1997, Vol 377-79, pp 1094-1100, issn 0039-6028Conference Paper

Photoelectron diffraction from Ni(001)c(2×2)-S(2p) = Diffraction de photoélectrons sur Ni(001)c(2×2)-S(2p)DAIMON, H; ITO, H; SHIN, S et al.Journal of the Physical Society of Japan. 1984, Vol 53, Num 10, pp 3488-3497, issn 0031-9015Article

Comment on: Structural analysis of the SiO₂/Si(100) interface by means of photoelectron diffraction. Authors' replyBONGIORNO, Angelo; PASQUARELLO, Alfredo; DREINER, S et al.Physical review letters. 2005, Vol 94, Num 18, pp 189601.1-189602.1, issn 0031-9007Article

Holographic reconstruction of Si(111) atom positions from energy- and angle-resolved photoelectron diffractionWESTPHAL, C; DREINER, S; SCHÜRMANN, M et al.Surface science. 2000, Vol 462, Num 1-3, pp 103-122, issn 0039-6028Article

Surface core-level shift photoelectron diffraction from As/Si(111)JOHANSSON, L. S. O; GUNNELLA, R; BULLOCK, E. L et al.Applied surface science. 1996, Vol 104-05, pp 88-94, issn 0169-4332Conference Paper

A new spherical-wave approximation for photoelectron diffraction, EXAFS and MEEDFRITZSCHE, V.Journal of physics. Condensed matter (Print). 1990, Vol 2, Num 6, pp 1413-1424, issn 0953-8984Article

Global search algorithms in surface structure determination using photoelectron diffractionDUNCAN, D. A; CHOI, J. I. J; WOODRUFF, D. P et al.Surface science. 2012, Vol 606, Num 3-4, pp 278-284, issn 0039-6028, 7 p.Article

Giant temperature-dependence in angle-resolved ultraviolet-photoemission from Au(100)MATZDORF, R; PANIAGO, R; MEISTER, G et al.Surface science. 1995, Vol 343, Num 3, pp L1182-L1186, issn 0039-6028Article

Correlation expansion : a powerful alternative multiple scattering calculation methodHAIFENG ZHAO; SEBILLEAU, Didier; ZIYU WU et al.Journal of physics. Condensed matter (Print). 2008, Vol 20, Num 27, issn 0953-8984, 275241.1-275241.10Article

Surfactant effect and dissolution of ultrathin fe films on Ag(001)TERRENI, S; COSSARO, A; CANEPA, M et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 11, pp 115420.1-115420.5, issn 1098-0121Article

Surface core-level shift photoelectron diffraction study of β-SiC(001)-c(2 × 2) surfaceSHIMOMURA, M; YEOM, H. W; MUN, B. S et al.Surface science. 1999, Vol 438, Num 1-3, pp 237-241, issn 0039-6028Conference Paper

Calculating spin and angular resolved photoelectron diffraction spectra for magnetiteRENNERT, P; MÜCK, W; CHASSE, A et al.Surface science. 1996, Vol 357-58, pp 260-264, issn 0039-6028Conference Paper

Shortcomings of separable representations of the Green function in multiple-scattering theory for photoelectron diffraction and extended X-ray absorption fine structureFRITZSCHE, V.Journal of electron spectroscopy and related phenomena. 1992, Vol 58, Num 4, pp 299-314, issn 0368-2048Article

New ways of characterizing layered silicates and their intercalates = Nouvelles façons de caractériser les phyllosilicates et leur intercalationsTHOMAS, J. M.Philosophical transactions of the royal society of London, series A : mathematical and physical sciences. 1984, Vol 311, Num 1517, pp 271-285, issn 0080-4614Article

Full-potential multiple scattering for core electron spectroscopiesHATADA, Keisuke; HAYAKAWA, Kuniko; BENFATTO, Maurizio et al.Journal of physics. Condensed matter (Print). 2009, Vol 21, Num 10, issn 0953-8984, 104206.1-104206.12Conference Paper

Angle-dependent oscillations in valence-band photoemission intensity of C₆₀HE, S; ARITA, M; NAMATAME, H et al.Journal of physics. Condensed matter (Print). 2007, Vol 19, Num 2, issn 0953-8984, 026202.1-026202.8Article

Structural analysis of Pt(111 )c(√3 x 5)rect.-CO using photoelectron diffractionNISBET, G; LAMONT, C. L. A; POLCIK, M et al.Surface science. 2007, Vol 601, Num 5, pp 1296-1303, issn 0039-6028, 8 p.Article

Multiple scattering investigation of the 1T-TaS₂ surface terminationDESPONT, L; CLERC, F; GARNIER, M. G et al.The European physical journal. B, Condensed matter physics. 2006, Vol 52, Num 3, pp 421-426, issn 1434-6028, 6 p.Article

Adsorption bond length for H₂O on TiO₂(110) : A key parameter for theoretical understandingALLEGRETTI, F; O'BRIEN, S; POLCIK, M et al.Physical review letters. 2005, Vol 95, Num 22, pp 226104.1-226104.4, issn 0031-9007Article